Detalle de: Improved Bayesian image denoising based on wavelets with applications to electron microscopy
| Title | Improved Bayesian image denoising based on wavelets with applications to electron microscopy |
| Abstract | |
| Apa Reference | Sorzano, C., Ortiz, E., López, M. & Rodrigo, J. (2006). Improved Bayesian image denoising based on wavelets with applications to electron microscopy. Pattern Recognition, 39(6), 1205-1213. 10.1016/j.patcog.2005.12.009 |
| Doi | 10.1016/j.patcog.2005.12.009 |
| Publication Date | Jun 2006 |
| Publication Type | Article |
| Researcher | Carlos Oscar Sorzano |
| Ontology | Experimental structure determination, Image analysis, Bayesian statistics |
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